Accurate thermal diffusivity and thermal conductivity measurements between RT and 1250°C with Xenon Flash

The LFA 467 HT HyperFlash® is based on the already-established LFA 467 HyperFlash® technology and requires no laser class due to the innovative light source system. The long lifetime of the xenon lamp provides cost-effective measurements until 1250°C without costly consumables.

Ultra-fast sampling rate (up to 2 MHz) and extremely short pulse widths (up to 20 µs) enabling measurement of thin and highly conducting materials

The data acquisition rate of the LFA 467 HyperFlash® series was increased to 2 MHz. This acquisition rate applies to both the IR detector and the pulse mapping channels. Thereby, highly conductive and/or thin materials requiring very short test times can be reliably tested.