DMA EPLEXOR 6000 - Ultra-High Force Series up to 6000 N
These instruments offer static and additional dynamic force levels from max. ± 2000 N to max. ± 6000 N each, and are thus the perfect choice for investigating the dynamic mechanical (or only static) properties of rigid samples as well as of specimens with larger dimensions – even component parts. Thanks to their modular design, ultra-high force DMTA instruments can accommodate add-ons to additionally carry out tests on such properties as fatigue, heat build-up, blow-out, or rolling resistance.
All testing machines in this series are conform to standards such as DIN 53513, DIN 53533, ISO 6721/1, ISO 6721/4, ISO 6721/5, ISO 6721/6, ISO 4664, ISO 4666/3, ISO 4666/4, ASTM D623, ASTM D4065, and ASTM D4473.
All testing machines in this series are conform to standards such as DIN 53513, DIN 53533, ISO 6721/1, ISO 6721/4, ISO 6721/5, ISO 6721/6, ISO 4664, ISO 4666/3, ISO 4666/4, ASTM D623, ASTM D4065, and ASTM D4473.
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Specifications
Specifications
| Temperature range | -150°C to 1500°C (three furnaces) |
| Frequency range | 0.01 to 100 Hz; optional: 0.0001 Hz and 200 Hz; selected frequencies up to 1000 Hz possible |
| Static force range | 2000 N, 4000 N or 6000 N (depending on instrument type; see table) |
| Dynamic force range | ± 2000 N, ± 4000 N, ± 6000 N (depending on instrument type; see table) |
| Force sensor | interchangeable; nominal forces available up to 12000 N |
| Blade Springs | for compensating of high static forces and for extending the operation range |
| Static displacement | Max. 50 mm |
| Dynamic displacement | up to ± 9 mm (EPLEXOR® 2000N / 4000N) or up to ± 25 mm (EPLEXOR® 6000N); each instrument can be equipped with two strain transducers |
| Additional measuring modes | creep, relaxation, fatigue, heat build-up, curing, tensile tests |
| Automatic sample length/thickness determination in tension, compression and bending geometry | |
| Automatic sample changer | max. 160 samples of the same geometry (ASC), as well for differing sample holder geometries (MPAS) |