PortaSpec® XLE is an instrumental technique that could non-destructively analyze light elements using wavelength dispersive X-ray (WDXR) fluorescence. The PortaSpec® XLE has the ability to analyze powders and solids with its included single position sample holder. It also has a single element option for Al, Si, P, S, Cl, K, Ca, or Zr and can measure Zirconium or Phosphorus pretreatment.