DMA 503 Eplexor® HT
DMA 503 Eplexor® HT: Unrivaled High-Temperature DMA Capabilities
The DMA 503 Eplexor® HT series stands alone in the market, capable of performing dynamic mechanical analysis (DMA) measurements with a substantial dynamic force of 500 N at temperatures reaching up to 1500°C.
This system offers a dedicated high-temperature furnace, operating from room temperature (RT) up to 1500°C. When coupled with a simultaneously mounted standard furnace (covering -160°C to 500°C), the Eplexor® HT instruments can conduct consecutive tests across a vast temperature spectrum, encompassing -160°C to 1500°C. The system’s intelligent electronics automatically detect which furnace is currently active, streamlining your workflow.
The DMA 503 Eplexor® HT series stands alone in the market, capable of performing dynamic mechanical analysis (DMA) measurements with a substantial dynamic force of 500 N at temperatures reaching up to 1500°C.
This system offers a dedicated high-temperature furnace, operating from room temperature (RT) up to 1500°C. When coupled with a simultaneously mounted standard furnace (covering -160°C to 500°C), the Eplexor® HT instruments can conduct consecutive tests across a vast temperature spectrum, encompassing -160°C to 1500°C. The system’s intelligent electronics automatically detect which furnace is currently active, streamlining your workflow.
Specifications
Specifications
Dynamic force range | ± 100 N (200 N)* | ± 150 N (300 N)* | ± 500 N (1000 N)* |
Static force range | 1500 N | 1500 N | 1500 N |
Dynamic displacement | ± 2 mm (4 mm)* | ± 3 mm (6 mm)* | ± 6 mm (12 mm)* |
Static displacement | Up to 80 mm; 45 mm with furnace |
||
Frequency range | 0.0001 Hz to 100 Hz; for fatigue up to 200 Hz | ||
Heating | RT to 1500°C | ||
Cooling | AIC: -70°C to 500°C LN₂: -160°C to 500°C |
||
Accessories | Automatic sample changer, humidity, immersion, purge gas | ||
Deformation modes | Compression, tension, bending, cantilever, shear | ||
Software | Master curve, segments, creep/relax, load sweep, fatigue, time sweep, temperature sweep, frequency sweep, temperature-frequency sweep, universal test, hysteresis, pulse |